Double-polished Silicon Wafer 4-inch N-type P-type Vacuum Electron Microscope SEM Coating Sensor Test Infrared Radiation
![Double-polished Silicon Wafer 4-inch N-type P-type Vacuum Electron Microscope SEM Coating Sensor Test Infrared Radiation](https://images2.productserve.com/?w=200&h=200&bg=white&trim=5&t=letterbox&url=ssl%3Aimages.nexusapp.co%2Fassets%2F56%2F48%2F92%2F164417766.jpg&feedId=52931&k=c4941dcdd7dd8661c3733a0c52c3e796e3bf5d67)
Double-polished Silicon Wafer 4-inch N-type P-type Vacuum Electron Microscope SEM Coating Sensor Test Infrared Radiation
Barcode: 08799360071707
Brand: ProductsPro
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